Ion Milling Systems Suppliers in West Chester, Pennsylvania

Ion milling systems use an ion beam to thin samples for transmission electron microscopy. Focused ion beam (FIB) systems use a narrow high current beam to mill specific regions or a low current beams to image samples (FIM). (more)
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Structure Probe, Inc.
Address: 206 Garfield Ave. PO Box 656, West Chester, PA 19381-0656 United States
Business Type: Manufacturer, Distributor, Service

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